Silicon -- crystal perfection

211. F. Spaepen and A. Eliat, "New methods for determining the void content of silicon single crystals", IEEE Transactions on Instrumentation and Measurements, 48:230-232 (1999). [CM25]

259. C.-Y. Wen and F. Spaepen, "Filling the voids in silicon single crystals by precipitation of Cu 3 Si", to appear in the Philosophical Magazine.
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260. C.-Y. Wen and F. Spaepen, "In-situ electron microscopy of the phases of Cu 3 Si", to appear in the Philosophical Magazine.
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